Effective dissociation cross section for the low-energy (0.5-31 eV) electron impact on solid hexane thin films

Leclerc Grégoire, Cui Zuolin, Sanche Léon. 1987. Effective dissociation cross section for the low-energy (0.5-31 eV) electron impact on solid hexane thin films. Journal of Physical Chemistry, 91 (26) : 6461-6463.

Résumé : We describe a low-energy electron impact experiment, performed on thin n-hexane films held at 80 K, that was designed for the measurement of the effective dissociation cross section in the energy range 0.5-31 eV. The onset of dissociation was found at =~3,6 eV incident electron energy, implicating the excitation of a low-lying triplet state. High dissociation rates at electron energies close to the ionization threshold were correlated to dissociative excited singlet and superexcited states.

Mots-clés Agrovoc : mesure (activité), radiation, film

Classification Agris : U30 - Méthodes de recherche

Auteurs et affiliations

• Leclerc Grégoire, Université de Sherbrooke (CAN)
• Cui Zuolin, Université de Sherbrooke (CAN)
• Sanche Léon, Université de Sherbrooke (CAN)

Source : Cirad - Agritrop (https://agritrop.cirad.fr/561346/)

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