Gourlot Jean-Paul, Frydrych Richard, Héquet Eric, Thollard F., Constantin O., Bachelier Bruno.
1995. Seed coat fragments, a major source of cotton yarn imperfections.
In : Beltwide Cotton Conference, San Antonio, USA, January 4-7, 1995
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Version publiée
- Anglais
Utilisation soumise à autorisation de l'auteur ou du Cirad. document_567890.pdf Télécharger (634kB) | Prévisualisation |
Résumé : A method to differentiate cultivars depending on their SCFcontents on yarn was developped in CIRAD CA using a GGP Uster Eveness Tester. Results indicate a high SCF heritability,but fabrication of yam is too costly to be used for breeding programs. 50, anew method, using image analysis, has been developped for counting andsizing up SCF on card web. SCF counts were made on card web and compared to those obtained by Uster Tester III on 20 texn 37 tex yarns for 30 cottons. Number of SCF on yarn can bi predicted wiht R² as great as 80%.
Classification Agris : Q60 - Traitement des produits agricoles non alimentaires
Auteurs et affiliations
- Gourlot Jean-Paul, CIRAD-CA-COTON (FRA) ORCID: 0000-0002-3231-3242
- Frydrych Richard, CIRAD-CA-COTON (FRA)
- Héquet Eric, CIRAD-CA-COTON (FRA)
- Thollard F., IUP de Montpellier (FRA)
- Constantin O., IUT de Montpellier (FRA)
- Bachelier Bruno, CIRAD-CA-COTON (CMR) ORCID: 0000-0002-6221-6996
Source : Cirad - Agritrop (https://agritrop.cirad.fr/567890/)
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