Résultats pour Auteur : "Van Looy, Kris"

An OBIA for fine-scale land cover spatial analysis over broad territories: Demonstration through riparian corridor and artificial sprawl studies in France. Tormos Thierry, Dupuy Stéphane, Van Looy Kris, Barbe Eric, Kosuth Pascal. 2012. In : 4th International Conference on GEographic Object-Based Image Analysis (GEOBIA 2012), Rio de Janeiro, Brésil, 07- 09 may 2012. Pontifical Catholic University of Rio de Janeiro (PUC-Rio) ; Brazilian National Institute for Space Research (INPE). s.l. : s.n., 1 p. International Conference on GEographic Object-Based Image Analysis (GEOBIA 2012). 4, Rio de Janeiro, Brésil, 7 Mai 2012/9 Mai 2012.