Characterization of whole plant leaf area properties using laser scanner point clouds.
Louarn Gaëtan, Carré Serge, Eprinchard Annie, Combes Didier, Boudon Frédéric.
2012.
In : Plant growth modeling, simulation, visualization and applications. Proceedings PMA12 : The Fourth International Symposium on Plant Growth Modeling, Simulation, Visualization and Applications, Shanghai, China, 31 October-3 November 2012. Kang Meng Zhen (ed.), Dumont Yves (ed.), Guo Yan (ed.)
. Piscataway : IEEE, 250-253.
ISBN 978-1-4673-0068-1 International Symposium on Plant Growth Modeling, Simulation, Visualization and Applications (PMA12). 4, Shanghai, Chine, 31 Octobre 2012/3 Novembre 2012.